Optical and Solid State Properties of Manganese Sulphide (MnS) Thin Film; Theoretical Analysis

E Ugwu

Abstract


Analysis of the optical and Solid State properties of MgS thin film using theoretical approach of beam propagation technique in which a scalar wave is propagated through the material thin film deposited on a substrate with the assumption that the dielectric medium has homogenous reference dielectric constant term, and a perturbed dielectric term, representing the deposited thin film medium is presented in this work. These two terms, constituted arbitrary complex dielectric function that describes dielectric perturbation imposed by the medium of for the system. This is substituted into a defined scalar wave equation in which the appropriate Green’s Function was defined on it and solved using series solution technique in conjunction with Born approximation method in order to obtain a model equation of wave propagating through the thin film. This was used in computing the propagated field for different input regions of field wavelength such as ultraviolet, visible and infrared region respectively during which the influence of the dielectric constants of the thin film on the propagating field were considered. The results obtained from the computed field were used in turn to compute the band gaps, solid state and optical properties of the thin film such as reflectance, Transmittance and reflectance. The electrical and optical conductance was also computed.


Full Text:

PDF

References


Lokhande C.D. Ennaoui A. Patil P.S Giersig M. Muller M. Diesner K. and Tributsch H. (1998)a Process and Characterization of Chemical Bath deposited manganese Sulphide(MnS), Thin Film, Thin Solid Film 330(2) 70-75 Crossref

Lokhande C.D. Ennaoui A. Tributsch H. (1998)b Structure and Surface Core Level Shifts of the GaAs (114) Appl. Surface Science, 187, 101

Anuar K, Saravaman N, Tan W, Ho and Teo (2010) Chemical Bath Deposition of Nickel Sulphide (Ni4 S3) Thin Film. Leonardo J.sci. Issue 16 1-1

Van Roey J.,Vander D. and P.E. Lagasse (1981)Beam Propagation Method; analysis and assessment J.Opt Soc .Am Vol.71 7 Crossref

Ugwu E.I.,Eke V.O.C and Elechi O (2012)a Ugwu E.I.,Eke V.O.C and Elechi O (2012) Study of the Impact of Dielectric Constant Perturbation on Electromagnetic Wave Propagation through Material Medium; MathCAD Solution IISTE Vol 2, No.6.p 1-10

Ong H.L (1993) 2 x 2 Propagation Matrices for Electromagnetic Wave Propagating Obliquely in Layered Inhomogeneous Uniaxial Media. J. Opt. Soc. Am. (1993) Vol 10, No 2, p. 283-293 Crossref

Van Roey J.J, Vander D and PE Lagasse Beam Propagation Method: Analysis and Assessment, J.Opt Soc.Am, (1981) Vol. 71, No. 7.

Ugwu E.I, P.C Uduh and Agbo G.A (2007), The Effect of Change in Refractive Index on Wave propagation Through (FeS2), Thin Film, J.Appl. Sc. 7(4) 570-574 Crossref

Ugwu E.I and P.C Uduh (2005) Effect of the Electrical Conductivity of FeS2 Thin Film on E.M Wave Propagation, JICOTECH Maiden Edition, 121-127

Valanju P.M, Walser R.M and Valanju P.A (2002) Wave Refraction in Negative-Index Media; Always Negative and Very Inhomogeneous, Phy. Rev.Lett. 88 187401 Crossref

Pentry J.B and Smith D.R. (2003), Commentry on ‘Wave Refraction in Negative- Index Media: Always Positive and Very Inhomogeneous’,Phy. Rev Lett. 90, 029703 Crossref

Ugwu Emmanuel I, Eke Vincent O.C and Elechi Onyekachi (2012) Analysis of Dielectric Constants and Optical Properties of Magnesium: Beam Propagation Approach GJ Ph.Sci.Vol,2(2). 050-055

Ugwu, E.I, Eke Vincent O.C and Elechi Onyekachi (2012), Study of the Impact of Dielectric Constant Perturbation on Electromagnetic Wave Propagation through Material Medium: Mathcad Solution, Chemistry and Material Research (2012) ,Vol.2, No.6

Ugwu E.I (2010) Theoretical Study of Field Propagation Through a nonhomogeneous Thin Film Medium Using Lippmann-Schwinger Equation, Intl. J MultiPhysicsVol.4.No.4 305- 315 Crossref

Martin J.F, Alain D.and Christian G. (1994) J.Opt. Alternative Scheme of Computing Exactly the Total Field Propagating in dielectric Structure of Arbitrary Shape Soc. Am A Vol.1, No.3, 1073-1080 Crossref

Chopra, K.L, Kainthla, D.K Pandya (1982) Physics of Thin Film, Academic Press, New York,169-235. [17] Nadeem, M.Y and Waga, (2000), Optical Properties of ZnS Thin Film.Turkish, J. Phy., 24-2000,651-659




DOI: http://dx.doi.org/10.21152/1750-9548.11.2.137

Copyright (c) 2017 E Ugwu

Creative Commons License
This work is licensed under a Creative Commons Attribution 4.0 International License.